Please use this identifier to cite or link to this item:
http://cmuir.cmu.ac.th/jspui/handle/6653943832/61087
Title: | Effects of V additions on the mechanical behavior of Au thin films for MEMS contact switches |
Authors: | T. Bannuru S. Narksitipan W. L. Brown R. P. Vinci |
Authors: | T. Bannuru S. Narksitipan W. L. Brown R. P. Vinci |
Keywords: | Engineering;Physics and Astronomy |
Issue Date: | 30-Apr-2007 |
Abstract: | Au, Au-V solid solution, and Au-V2O5dispersion films were fabricated for comparison of electrical and mechanical characteristics. Resistivity and nanoindentation hardness increased with increasing V content in all films, but the ratio of resistivity increase to hardness increase was much lower for the Au-V2O5films. Measurements of contact force and electrical contact resistance between pairs of Au or Au-V films show that increased hardness and resistivity in the alloy films results in higher contact resistance and less adhesion than in pure Au. These results imply that the Au-V2O5films may exhibit attractive behavior when used in a contact configuration, but this has not yet been tested. |
URI: | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=34247356929&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/61087 |
ISSN: | 0277786X |
Appears in Collections: | CMUL: Journal Articles |
Files in This Item:
There are no files associated with this item.
Items in CMUIR are protected by copyright, with all rights reserved, unless otherwise indicated.