Please use this identifier to cite or link to this item: http://cmuir.cmu.ac.th/jspui/handle/6653943832/60400
Title: Dielectric properties and microstructure of CaCu3Ti 4-xMnxO12 ceramics
Authors: W. Makcharoen
J. Tontrakoon
P. Thavornyutikarn
D. P. Cann
T. Tunkasiri
Keywords: Engineering
Materials Science
Issue Date: 1-Dec-2008
Abstract: In this work, we have reported the dielectric properties and microstructure of the Mn doped CaCu3Ti4O12 (CCTO) ceramics. The conventional solidstate reaction was employed. By the partial Mn -for Ti substitution, the dielectric loss was suppressed remarkably while the dielectric constant (εr) still remains high. The sample CaCu 3Ti3.76Mn0.24O12 exhibits a high εr over 1200 and a low dielectric loss below 0.06 at room temperature. Furthermore, the εr value of this sample shows rather independent with temperature. SEM micrographs show that the sample is dense ( ≥ 90% of theoretical density) and the grain size of the samples was gradually reduced with increasing x. This CaCu3Ti4-x MnxO12 system is believed to be a promising candidate for capacitor applications.
URI: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=58149518400&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/60400
Appears in Collections:CMUL: Journal Articles

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