Please use this identifier to cite or link to this item: http://cmuir.cmu.ac.th/jspui/handle/6653943832/61762
Title: Structural and electrical properties characterization of (1-x)PbZr <inf>0.52</inf>Ti<inf>0.48</inf>O<inf>3</inf>-xBaFe<inf>0.5</inf>Nb <inf>0.5</inf>O<inf>3</inf> system
Authors: S. Eitssayeam
U. Intatha
G. Rujijanagul
K. Pengpat
T. Tunkasiri
Keywords: Materials Science
Physics and Astronomy
Issue Date: 1-May-2006
Abstract: The structural and electrical properties of (1-x)PbZr0.52Ti 0.48O3-xBaFe0.5Nb0.5O3 ceramics system with the composition near the morphotropic phase boundary were investigated as a function of the BaFe0.5Nb0.5O 3 content by X-ray diffraction (XRD) and dielectric measurement technique. Studies were performed on the samples prepared by solid state reaction for x=0.1, 0.2, 0.3, 0.4 and 0.5. The XRD analysis demonstrated that with increasing BFN content in (1-x)PZT-xBFN, the structural change occurred from the tetragonal to the cubic phase at room temperature. Changes in the dielectric behavior were then related to these structural depending on the BFN content.
URI: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33645301889&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/61762
ISSN: 14320630
09478396
Appears in Collections:CMUL: Journal Articles

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