Please use this identifier to cite or link to this item: http://cmuir.cmu.ac.th/jspui/handle/6653943832/53553
Title: Optical interferometric technique for induced strain ferroelectric loop study at low frequency
Authors: Siripong Somwan
Khem Chirapatpimol
Apichart Limpichaipanit
Komsanti Chokethawai
Athipong Ngamjarurojana
Keywords: Engineering
Issue Date: 1-Jan-2014
Abstract: Michelson interferometric technique was modified in the setup and used to measure very small changes in optical path length for electric field induced-strain phenomena. Induced-strain is established in the sample when the beam of light propagating through the sample surface undergoes a shift in phase, which in turn leads to a change in the intensity of the interference pattern formed where the reference and probing beams recombine. In this work the electric field induced-strain was measured as a function of electric field (s-E loop) and polarization (s-P loop) of PbMg1/3Nb2/3O3(PMN) and 0.7PbMg1/3Nb2/3O3-0.3PbZr0.52Ti0.48O3(0.7PMN-0.3PZT) ceramics, which showed electrostrictive (quadratic shape curve) and piezoelectric (butterfly shape curve) behavior at various frequency (0.01-1Hz). © (2014) Trans Tech Publications, Switzerland.
URI: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84904052484&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/53553
ISSN: 16628985
10226680
Appears in Collections:CMUL: Journal Articles

Files in This Item:
There are no files associated with this item.


Items in CMUIR are protected by copyright, with all rights reserved, unless otherwise indicated.