Photo and X-ray luminescence characteristics of CeF<inf>3</inf> -doped SiO<inf>2</inf> + B<inf>2</inf>O<inf>3</inf> +AlF<inf>3</inf> + NaF + CaF<inf>2</inf> scintillating glasses

Abstract

Fluoroborosilicate (SBFanc:SiO2 + B2O3 +AlF3 + NaF + CaF2) glasses with different CeF3 concentrations were fabricated by melt quenching technique to examine the scintillation properties of these glasses. The density and refractive index increase with an increase in CeF3 concentration. The structural properties of glasses were studied in the range of 800–4000 cm−1 using FT-IR transmittance spectroscopy. Luminescence characteristics of Ce3+:SBFanc glasses with an intensity peak around ∼345 nm (5d→4f) were studied using photo (λexc = 303 nm) and X-ray excited luminescence techniques. The energy transfer (ET) between Ce3+ -Ce3+ ion pairs taking place via dipole-dipole type interaction for the concentration quenching of Ce3+ emission on the basis of Dexter and Schulman theory. The PL decay curves can be fitted by a double exponential function with the decay times 64.28–99.87 ns and 15.78–21.29 ns for slow and fast decay components, respectively. The highest integrated light emission intensity of Ce3+:SBFanc glasses stimulated by X-ray is 35% of commercial Bi4Ge3O12 crystal and can be used for the scintillator materials.