Please use this identifier to cite or link to this item: http://cmuir.cmu.ac.th/jspui/handle/6653943832/73336
Full metadata record
DC FieldValueLanguage
dc.contributor.authorT. Mameeen_US
dc.contributor.authorW. Anukoolen_US
dc.contributor.authorN. Thaicharoenen_US
dc.contributor.authorN. Chattrapibanen_US
dc.contributor.authorP. Sompeten_US
dc.date.accessioned2022-05-27T08:39:23Z-
dc.date.available2022-05-27T08:39:23Z-
dc.date.issued2022-01-07en_US
dc.identifier.issn17426596en_US
dc.identifier.issn17426588en_US
dc.identifier.other2-s2.0-85123675304en_US
dc.identifier.other10.1088/1742-6596/2145/1/012024en_US
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85123675304&origin=inwarden_US
dc.identifier.urihttp://cmuir.cmu.ac.th/jspui/handle/6653943832/73336-
dc.description.abstractWe establish an algorithm and computational results based on heuristic rearrangement of randomly filled array toward a defect-free and compact array. In this approach, the vacancies are filled from the inner layer that is related to the distance from the center of each loading site. By rearranging the position of atoms that maximize the compactness of the system layer by layer, the algorithm is set to iterate until the compactness reaches its local maximum. The results show that by applying the algorithm, the compactness of the system converges up to ∼97% of the theoretical maximum.en_US
dc.subjectPhysics and Astronomyen_US
dc.titleHeuristic compactness maximization algorithm for two-dimensional single-atom traps rearrangementen_US
dc.typeConference Proceedingen_US
article.title.sourcetitleJournal of Physics: Conference Seriesen_US
article.volume2145en_US
article.stream.affiliationsMinistry of Higher Education, Science, Research and Innovationen_US
article.stream.affiliationsChiang Mai Universityen_US
Appears in Collections:CMUL: Journal Articles

Files in This Item:
There are no files associated with this item.


Items in CMUIR are protected by copyright, with all rights reserved, unless otherwise indicated.