Please use this identifier to cite or link to this item: http://cmuir.cmu.ac.th/jspui/handle/6653943832/61396
Full metadata record
DC FieldValueLanguage
dc.contributor.authorS. Pompen_US
dc.contributor.authorU. Tippawanen_US
dc.date.accessioned2018-09-10T04:10:47Z-
dc.date.available2018-09-10T04:10:47Z-
dc.date.issued2007-03-11en_US
dc.identifier.issn01689002en_US
dc.identifier.other2-s2.0-33846920338en_US
dc.identifier.other10.1016/j.nima.2006.11.058en_US
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33846920338&origin=inwarden_US
dc.identifier.urihttp://cmuir.cmu.ac.th/jspui/handle/6653943832/61396-
dc.description.abstractA new method for correcting charged-particle spectra for thick-target effects is described. Starting with a trial function, inverse response functions are found by an iterative procedure. The variances corresponding to the measured spectrum are treated similarly and in parallel. Oscillations of the solution are avoided by rebinning the data to finer bins during a correction iteration and back to the original or wider binning after each iteration. This thick-target correction method has been used for data obtained with the MEDLEY facility at the The Svedberg Laboratory, Uppsala, Sweden, and is here presented in detail and demonstrated for two test cases. © 2006 Elsevier B.V. All rights reserved.en_US
dc.subjectPhysics and Astronomyen_US
dc.titleAn iterative procedure to obtain inverse response functions for thick-target correction of measured charged-particle spectraen_US
dc.typeJournalen_US
article.title.sourcetitleNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipmenten_US
article.volume572en_US
article.stream.affiliationsUppsala Universiteten_US
article.stream.affiliationsChiang Mai Universityen_US
Appears in Collections:CMUL: Journal Articles

Files in This Item:
There are no files associated with this item.


Items in CMUIR are protected by copyright, with all rights reserved, unless otherwise indicated.