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dc.contributor.authorRattikorn Yimnirunen_US
dc.contributor.authorNarit Triamnaken_US
dc.contributor.authorAthipong Ngamjarurojanaen_US
dc.contributor.authorYongyut Laosiritawornen_US
dc.contributor.authorSupon Anantaen_US
dc.description.abstractEffects of compressive stress on the dielectric properties of PZT-PZN ceramics with a formula (1-x) Pb(Zr1/2Ti1/2)O3-xPb(Zn1/3Nb2/3)O3or (1-x) PZT-(x)PZN(x = 0.1-0.5) were investigated under stress up to 230 MPa. The experimental results revealed that the superimposed compression stress had pronounced effects on both the dielectric constant and the dielectric loss tangent of PZT-PZN ceramics. In addition, the dielectric properties were considerably lowered after a stress cycle. The observations were mainly interpreted in terms of domain switching through non-180° domain walls, clamping of domain walls, de-aging, and the stress induced decrease in switchable part of spontaneous polarization.en_US
dc.subjectMaterials Scienceen_US
dc.subjectPhysics and Astronomyen_US
dc.titleDielectric properties of Pb(Zr1/2Ti1/2)O 3-Pb(Zn1/3Nb2/3)O3 ceramics under compressive stressen_US
article.volume355en_US Mai Universityen_US
Appears in Collections:CMUL: Journal Articles

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