Please use this identifier to cite or link to this item: http://cmuir.cmu.ac.th/jspui/handle/6653943832/60370
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dc.contributor.authorA. Watcharapasornen_US
dc.contributor.authorS. Jiansirisomboonen_US
dc.date.accessioned2018-09-10T03:41:37Z-
dc.date.available2018-09-10T03:41:37Z-
dc.date.issued2008-12-01en_US
dc.identifier.issn10226680en_US
dc.identifier.other2-s2.0-62949214245en_US
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=62949214245&origin=inwarden_US
dc.identifier.urihttp://cmuir.cmu.ac.th/jspui/handle/6653943832/60370-
dc.description.abstractZirconium-doped bismuth sodium titanate ceramics were prepared using the conventional processing method. X-ray diffraction analysis indicated the materials were single phase with a systematic shift due to increased unit cell size. The measured densities and grain size of the ceramic samples were found to range from 5.79-6.03 g/cm3 and 0.5-1.6 μm, respectively. The dielectric constant as a function of temperature became broader as Zr content increased. The piezoelectric constant was found to decrease with increasing Zr. Within the range of the solid solutions investigated, the materials seem to be promising for high temperature applications where stable dielectric constant is required. © 2008 Trans Tech Publications, Switzerland.en_US
dc.subjectEngineeringen_US
dc.titleDielectric and piezoelectric properties of zirconium-doped bismuth sodium titanate ceramicsen_US
dc.typeBook Seriesen_US
article.title.sourcetitleAdvanced Materials Researchen_US
article.volume55-57en_US
article.stream.affiliationsChiang Mai Universityen_US
Appears in Collections:CMUL: Journal Articles

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