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DC Field | Value | Language |
---|---|---|
dc.contributor.author | N. Sirikulrat | en_US |
dc.date.accessioned | 2018-09-04T06:08:20Z | - |
dc.date.available | 2018-09-04T06:08:20Z | - |
dc.date.issued | 2012-02-29 | en_US |
dc.identifier.issn | 00406090 | en_US |
dc.identifier.other | 2-s2.0-84857357314 | en_US |
dc.identifier.other | 10.1016/j.tsf.2011.12.063 | en_US |
dc.identifier.uri | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84857357314&origin=inward | en_US |
dc.identifier.uri | http://cmuir.cmu.ac.th/jspui/handle/6653943832/51766 | - |
dc.description.abstract | The current-voltage (I-V) relationship of aluminum doped zinc oxide thin film-antimony doped barium strontium titanate single heterojunction diodes was investigated. The linear I-V characteristics are similar to those of the PN junction diodes. The linear conduction at a low forward bias voltage as predicted by the space charge limited current theory and the trap free square law at a higher forward voltage are observed. The overall current density-voltage (J-V) characteristics of the diodes are found to be well described by the Power Series Equation J=∑mCmVmwhere Cmis the leakage constant at particular power m with the best fit for the power m found to be at the fourth and fifth orders for the forward and reverse bias respectively. © 2011 Elsevier B.V. All rights reserved. | en_US |
dc.subject | Materials Science | en_US |
dc.subject | Physics and Astronomy | en_US |
dc.title | Power series fitting of current-voltage characteristics of Al doped ZnO thin film-Sb doped (Ba 0.8Sr 0.2)TiO 3 heterojunction diode | en_US |
dc.type | Journal | en_US |
article.title.sourcetitle | Thin Solid Films | en_US |
article.volume | 520 | en_US |
article.stream.affiliations | Chiang Mai University | en_US |
Appears in Collections: | CMUL: Journal Articles |
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