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dc.contributor.authorJ. Saisuten_US
dc.contributor.authorK. Kusoljariyakulen_US
dc.contributor.authorN. Kangrangen_US
dc.contributor.authorP. Wichaisirimongkolen_US
dc.contributor.authorC. Tengsirivattanaen_US
dc.contributor.authorP. Thamboonen_US
dc.contributor.authorM. W. Rhodesen_US
dc.contributor.authorC. Thongbaien_US
dc.date.accessioned2018-09-04T04:45:36Z-
dc.date.available2018-09-04T04:45:36Z-
dc.date.issued2010-11-30en_US
dc.identifier.other2-s2.0-78649351414en_US
dc.identifier.other10.1109/ICIMW.2010.5612867en_US
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=78649351414&origin=inwarden_US
dc.identifier.urihttp://cmuir.cmu.ac.th/jspui/handle/6653943832/50785-
dc.description.abstractThe THz radiation from femtosecond electron bunches is focused on a sample which will be scanned using an xy-translation stage. The transmission intensity at different points of the sample are detected to construct a THz image. THz images of some samples were demonstrated using the THz imaging system.en_US
dc.subjectEngineeringen_US
dc.titleTHz radiation based on femtosecond electron bunches and THz imagingen_US
dc.typeConference Proceedingen_US
article.title.sourcetitleIRMMW-THz 2010 - 35th International Conference on Infrared, Millimeter, and Terahertz Waves, Conference Guideen_US
article.stream.affiliationsChiang Mai Universityen_US
article.stream.affiliationsCommission on Higher Educationen_US
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