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dc.contributor.authorTitipun Thongtemen_US
dc.contributor.authorAnukorn Phuruangraten_US
dc.contributor.authorSomchai Thongtemen_US
dc.date.accessioned2018-09-04T04:43:22Z-
dc.date.available2018-09-04T04:43:22Z-
dc.date.issued2010-01-01en_US
dc.identifier.issn02728842en_US
dc.identifier.other2-s2.0-70350728410en_US
dc.identifier.other10.1016/j.ceramint.2009.07.027en_US
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=70350728410&origin=inwarden_US
dc.identifier.urihttp://cmuir.cmu.ac.th/jspui/handle/6653943832/50649-
dc.description.abstractDifferent molar ratios of Zn(NO3)2to NaOH were dissolved in de-ionized water, mixed to form solutions with different pH values and heated using 180 W microwave power (80 °C) in ambient atmosphere for 20 min. Wurtzite ZnO nanostructure was detected using an X-ray diffractometer (XRD) and a selected area electron diffraction (SAED) technique. The patterns were in accordance with those of the simulation. Scanning and transmission electron microscopes (SEM and TEM) revealed their nanostructures with different morphologies controlled by molar ratios of the starting agents as well as pH values of the solutions. High resolution transmission electron microscopic (HRTEM) technique shows that the crystallographic planes are aligned in lattice array. Seven different Raman wavenumbers at 334, 378, 410, 440, 541, 575 and 660 cm-1were used to specify that the products were wurtzite structured ZnO. Photoluminescence (PL) spectra show their emission peaks at 385-394 nm due to the recombination process of free excitons. © 2009 Elsevier Ltd and Techna Group S.r.l.en_US
dc.subjectChemical Engineeringen_US
dc.subjectMaterials Scienceen_US
dc.titleCharacterization of nanostructured ZnO produced by microwave irradiationen_US
dc.typeJournalen_US
article.title.sourcetitleCeramics Internationalen_US
article.volume36en_US
article.stream.affiliationsChiang Mai Universityen_US
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