Optical interferometric technique for induced strain ferroelectric loop study at low frequency

Abstract

Michelson interferometric technique was modified in the setup and used to measure very small changes in optical path length for electric field induced-strain phenomena. Induced-strain is established in the sample when the beam of light propagating through the sample surface undergoes a shift in phase, which in turn leads to a change in the intensity of the interference pattern formed where the reference and probing beams recombine. In this work the electric field induced-strain was measured as a function of electric field (s-E loop) and polarization (s-P loop) of PbMg1/3Nb2/3O3(PMN) and 0.7PbMg1/3Nb2/3O3-0.3PbZr0.52Ti0.48O3(0.7PMN-0.3PZT) ceramics, which showed electrostrictive (quadratic shape curve) and piezoelectric (butterfly shape curve) behavior at various frequency (0.01-1Hz). © (2014) Trans Tech Publications, Switzerland.