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DC Field | Value | Language |
---|---|---|
dc.contributor.author | S. Kaewjaeng | en_US |
dc.contributor.author | S. Kothan | en_US |
dc.contributor.author | C. Jumpee | en_US |
dc.contributor.author | S. Kiatwattanacharoen | en_US |
dc.contributor.author | N. Wongdamnern | en_US |
dc.contributor.author | C. Kedkaew | en_US |
dc.contributor.author | T. Sareein | en_US |
dc.contributor.author | J. Kaewkhao | en_US |
dc.date.accessioned | 2022-10-16T07:12:22Z | - |
dc.date.available | 2022-10-16T07:12:22Z | - |
dc.date.issued | 2021-01-01 | en_US |
dc.identifier.issn | 16078489 | en_US |
dc.identifier.issn | 10584587 | en_US |
dc.identifier.other | 2-s2.0-85122101682 | en_US |
dc.identifier.other | 10.1080/10584587.2021.1964283 | en_US |
dc.identifier.uri | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85122101682&origin=inward | en_US |
dc.identifier.uri | http://cmuir.cmu.ac.th/jspui/handle/6653943832/76554 | - |
dc.description.abstract | This work focused on radiation shielding parameters of 25Na2O: 5Al2O3: 10SiO2: (59.5-x)B2O3: 0.5CeF3: XGd2O3 when x = 0, 1, 3, 5 and 7 mol%. They were theoretically calculated by using the XCom program. The radiation shielding characteristic parameters for glass systems of different Gd2O3 compositions were found dependent on the X-ray in diagnosis energy regions. The results showed that the photoelectric effect, coherent scattering, mass attenuation coefficient, effective atomic number, incoherent (Compton) scattering, and effective electron density decreased with increasing energy region, while HVL and MFP increased. This work indicated that the radiation shielding glass samples are good radiation materials for X-ray shielding applications in the future and can be candidate for radiation shielding material in diagnostic region energies. | en_US |
dc.subject | Engineering | en_US |
dc.subject | Materials Science | en_US |
dc.subject | Physics and Astronomy | en_US |
dc.title | Direct and Quantitative Study of Gd<sup>3+</sup> Doped on Na<inf>2</inf>O: Al<inf>2</inf>O<inf>3</inf>: SiO<inf>2</inf>: B<inf>2</inf>O<inf>3</inf>:CeF<inf>3</inf> Glass Samples for Radiation Interaction Parameters | en_US |
dc.type | Journal | en_US |
article.title.sourcetitle | Integrated Ferroelectrics | en_US |
article.volume | 223 | en_US |
article.stream.affiliations | Rajamangala University of Technology Suvarnabhumi | en_US |
article.stream.affiliations | Rajamangala University of Technology Phra Nakhon | en_US |
article.stream.affiliations | Nakhon Pathom Rajabhat University | en_US |
article.stream.affiliations | King Mongkut's University of Technology Thonburi | en_US |
article.stream.affiliations | Chiang Mai University | en_US |
Appears in Collections: | CMUL: Journal Articles |
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