Please use this identifier to cite or link to this item: http://cmuir.cmu.ac.th/jspui/handle/6653943832/62124
Title: Taguchi experimental design for manufacturing process optimisation using historical data and a neural network process model
Authors: Wimalin Sukthomya
James D T Tannock
Keywords: Business, Management and Accounting
Issue Date: 27-Jun-2005
Abstract: Purpose - The paper describes the methods of manufacturing process optimization, using Taguchi experimental design methods with historical process data, collected during normal production. Design/methodology/approach - The objectives are achieved with two separate techniques: the Retrospective Taguchi approach selects the designed experiment's data from a historical database, whilst in the Neural Network (NN) - Taguchi approach, this data is used to train a NN to estimate process response for the experimental settings. A case study illustrates both approaches, using real production data from an aerospace application. Findings - Detailed results are presented. Both techniques identified the important factor settings to ensure the process was improved. The case study shows that these techniques can be used to gain process understanding and identify significant factors. Research limitations/implications - The most significant limitation of these techniques relates to process data availability and quality. Current databases were not designed for process improvement, resulting in potential difficulties for the Taguchi experimentation; where available data does not explain all the variability in process outcomes. Practical implications - Manufacturers may use these techniques to optimise processes, without expensive and time-consuming experimentation. Originality/value - The paper describes novel approaches to data acquisition associated with Taguchi experimentation. © Emerald Group Publishing Limited.
URI: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=20444488149&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/62124
ISSN: 0265671X
Appears in Collections:CMUL: Journal Articles

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