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DC Field | Value | Language |
---|---|---|
dc.contributor.author | T. Kumpika | en_US |
dc.contributor.author | W. Thongsuwan | en_US |
dc.contributor.author | P. Singjai | en_US |
dc.date.accessioned | 2018-09-10T03:44:09Z | - |
dc.date.available | 2018-09-10T03:44:09Z | - |
dc.date.issued | 2008-06-30 | en_US |
dc.identifier.issn | 00406090 | en_US |
dc.identifier.other | 2-s2.0-43949088795 | en_US |
dc.identifier.other | 10.1016/j.tsf.2007.07.062 | en_US |
dc.identifier.uri | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=43949088795&origin=inward | en_US |
dc.identifier.uri | http://cmuir.cmu.ac.th/jspui/handle/6653943832/60511 | - |
dc.description.abstract | ZnO nanoparticle thin films were deposited on quartz substrates by a novel sparking deposition which is a simple and cost-effective technique. The sparking off two zinc tips above the substrate was done repeatedly 50-200 times through a high voltage of 10 kV in air at atmospheric pressure. The film deposition rate by sparking process was approximately 1.0 nm/spark. The ZnO thin films were characterized by X-ray diffraction, Raman spectroscopy, UV-vis spectrophotometry, and ionoluminescence at room temperature. The two broad emission peaks centered at 483 nm (green emission) and 650 nm (orange-red emission) were varied after two-step annealing treatments at 400-800 °C. Moreover, the electrical resistivity of the films was likely to be proportional to the peak intensity of the orange-red emission. © 2007 Elsevier B.V. All rights reserved. | en_US |
dc.subject | Materials Science | en_US |
dc.subject | Physics and Astronomy | en_US |
dc.title | Optical and electrical properties of ZnO nanoparticle thin films deposited on quartz by sparking process | en_US |
dc.type | Journal | en_US |
article.title.sourcetitle | Thin Solid Films | en_US |
article.volume | 516 | en_US |
article.stream.affiliations | Chiang Mai University | en_US |
Appears in Collections: | CMUL: Journal Articles |
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