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dc.contributor.authorW. Thongpanen_US
dc.contributor.authorT. Kumpikaen_US
dc.contributor.authorE. Kantaraken_US
dc.contributor.authorA. Panthawanen_US
dc.contributor.authorP. Pooseekheawen_US
dc.contributor.authorP. Singjaien_US
dc.contributor.authorA. Tuantranonten_US
dc.contributor.authorW. Thongsuwanen_US
dc.date.accessioned2018-09-05T04:38:53Z-
dc.date.available2018-09-05T04:38:53Z-
dc.date.issued2018-07-12en_US
dc.identifier.issn20710194en_US
dc.identifier.issn20710186en_US
dc.identifier.other2-s2.0-85050258400en_US
dc.identifier.other10.15407/ujpe63.6.531en_US
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85050258400&origin=inwarden_US
dc.identifier.urihttp://cmuir.cmu.ac.th/jspui/handle/6653943832/59132-
dc.description.abstract© W. THONGPAN, T. KUMPIKA, E. KANTARAK, A. PANTHAWAN, P. POOSEEKHEAW, P. SINGJAI, A. TUANTRANONT, W. THONGSUWAN, 2018. We have used an external electric field to increase both the uniformity and deposition rate of TiO2films. The experiment is carried out by sparking-off titanium wires with a high dc voltage of 1 kV (field Eint= 10 kV/cm) and a limited current of 3 mA. The external electric fields (Eext) of 3, 6, and 9 kV/cm were applied to the sparking system for 1–5 hours. The as-deposited film morphology was characterized by scanning electron microscopy. The results clearly show that the films are only deposited on the external electric field area. Furthermore, the deposition rate of the films increased from 40.7% to 77.8% in the presence of the external electric field of 9 kV/cm. The effects of an external electric field on both the deposition rate and uniformity of films are investigated and described.en_US
dc.subjectPhysics and Astronomyen_US
dc.titleExternal-electric-field-enhanced uniformity and deposition rate of a TiO<inf>2</inf>film prepared by the sparking processen_US
dc.typeJournalen_US
article.title.sourcetitleUkrainian Journal of Physicsen_US
article.volume63en_US
article.stream.affiliationsChiang Mai Universityen_US
article.stream.affiliationsThailand National Electronics and Computer Technology Centeren_US
Appears in Collections:CMUL: Journal Articles

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