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dc.contributor.authorYaowamarn Chuminjaken_US
dc.contributor.authorSuphaporn Daothongen_US
dc.contributor.authorPreeyaporn Reanpangen_US
dc.contributor.authorJohannes Philipp Mensingen_US
dc.contributor.authorDitsayut Phokharatkulen_US
dc.contributor.authorJaroon Jakmuneeen_US
dc.contributor.authorAnurat Wisitsoraaten_US
dc.contributor.authorAdisorn Tuantranonten_US
dc.contributor.authorPisith Singjaien_US
dc.date.accessioned2018-09-04T10:10:03Z-
dc.date.available2018-09-04T10:10:03Z-
dc.date.issued2015-07-28en_US
dc.identifier.issn20462069en_US
dc.identifier.other2-s2.0-84939133426en_US
dc.identifier.other10.1039/c5ra09408aen_US
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84939133426&origin=inwarden_US
dc.identifier.urihttp://cmuir.cmu.ac.th/jspui/handle/6653943832/54251-
dc.description.abstract© The Royal Society of Chemistry. In this work, nickel oxide (NiO) films have been prepared by a sparking method on flexible chromium/gold coated polyethylene terephthalate substrates and investigated for electrochemical energy-storage applications. Structural characterizations by scanning/transmission electron microscopies, X-ray diffraction, X-ray photoelectron spectroscopy and a UV-vis spectrophotometer reveal that the film comprises polycrstalline NiO nanoparticles with diameters in the range of 3.0-6.0 nm loosely agglomerated into a porous foam-like network. The nanoporous sparked NiO films, exhibit remarkable energy-storage behavior with a high average specific charge capacity of 402.75 C g-1 at a discharge current of 1 A g-1 and a good capacity retention of 88% after 1000 cycles at a high discharge current of 40 A g-1. Thus, the sparking method is a promising alternative route for the preparation of high-performance electrochemical energy-storage devices.en_US
dc.subjectChemical Engineeringen_US
dc.subjectChemistryen_US
dc.titleElectrochemical energy-storage performances of nickel oxide films prepared by a sparking methoden_US
dc.typeJournalen_US
article.title.sourcetitleRSC Advancesen_US
article.volume5en_US
article.stream.affiliationsChiang Mai Universityen_US
article.stream.affiliationsMaejo Universityen_US
article.stream.affiliationsThailand National Electronics and Computer Technology Centeren_US
Appears in Collections:CMUL: Journal Articles

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