Please use this identifier to cite or link to this item: http://cmuir.cmu.ac.th/jspui/handle/6653943832/53896
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dc.contributor.authorA. Dechanaen_US
dc.contributor.authorP. Thamboonen_US
dc.contributor.authorD. Boonyawanen_US
dc.date.accessioned2018-09-04T10:00:49Z-
dc.date.available2018-09-04T10:00:49Z-
dc.date.issued2014-10-01en_US
dc.identifier.issn10897623en_US
dc.identifier.issn00346748en_US
dc.identifier.other2-s2.0-84908431286en_US
dc.identifier.other10.1063/1.4898802en_US
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84908431286&origin=inwarden_US
dc.identifier.urihttp://cmuir.cmu.ac.th/jspui/handle/6653943832/53896-
dc.description.abstract© 2014 AIP Publishing LLC. A microwave remote Plasma Enhanced-Atomic Layer Deposition system with multicusp confinement chamber is established at the Plasma and Beam Physics research facilities, Chiang Mai, Thailand. The system produces highly-reactive plasma species in order to enhance the deposition process of thin films. The addition of the multicusp magnetic fields further improves the plasma density and uniformity in the reaction chamber. Thus, the system is more favorable to temperature-sensitive substrates when heating becomes unwanted. Furthermore, the remote-plasma feature, which is generated via microwave power source, offers tunability of the plasma properties separately from the process. As a result, the system provides high flexibility in choice of materials and design experiments, particularly for low-temperature applications. Performance evaluations of the system were carried on coating experiments of Al2O3layers onto a silicon wafer. The plasma characteristics in the chamber will be described. The resulted Al2O3films - analyzed by Rutherford Backscattering Spectrometry in channeling mode and by X-ray Photoelectron Spectroscopy techniques - will be discussed.en_US
dc.subjectPhysics and Astronomyen_US
dc.titleMicrowave remote plasma enhanced-atomic layer deposition system with multicusp confinement chamberen_US
dc.typeJournalen_US
article.title.sourcetitleReview of Scientific Instrumentsen_US
article.volume85en_US
article.stream.affiliationsRajabhat Universityen_US
article.stream.affiliationsChiang Mai Universityen_US
Appears in Collections:CMUL: Journal Articles

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