Browsing by Author Y. Renier
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
|---|---|---|
| 1-Jan-2020 | Proof-of-principle tests for slit-scan-based slice emittance measurements at Pitz | R. Niemczyk; H. Huck; P. Boonpornprasert; Y. Chen; J. Good; M. Gross; I. Isaev; D. Kalantaryan; C. Koschitzki; M. Krasilnikov; X. Li; O. Lishilin; G. Loisch; D. Melkumyan; A. Oppelt; H. Qian; Y. Renier; C. Saisa-Ard; F. Stephan; Q. Zhao; W. Hillert |